Four years after the successful introducing of the Hitachi S-4800 CFE (Cold Field Emission) and the analytical S-4300 SE (Schottky Emission) into the market, we are proud to present our NEW versatile solution for analytical purposes in combination with high-resolution capabilities.

The new SU-70 delivers breath-taking probe currents up to 100nA and an impressing low kV-resolution for upcoming conceptual formulations.

Get convinced by this performance regarding to our Hitachi "semi-in-lens"-concept and the Field-Emission-Schottky-Gun. Take advantage of this uncompromising Scanning Electron Microscope (SEM).